VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science Book 711) 1st ed. 2017 Edition, Kindle Edition
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Product details
| Management number | 222470246 | Release Date | 2026/05/04 | List Price | $39.60 | Model Number | 222470246 | ||
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. Read more
| XRay | Not Enabled |
|---|---|
| ISBN13 | 978-9811074707 |
| Edition | 1st ed. 2017 |
| Language | English |
| File size | 59.5 MB |
| Page Flip | Enabled |
| Publisher | Springer |
| Word Wise | Not Enabled |
| Print length | 1432 pages |
| Accessibility | Learn more |
| Part of series | Communications in Computer and Information Science |
| Publication date | December 21, 2017 |
| Enhanced typesetting | Enabled |
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